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The silicon die with patternedlayer of SiO2 is coated with Pt
Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 20 Tip Coating: Amorphous Carbon Tip Set Back( RNG): 5 - 15
Calibration Artifact: 180nm Depth
These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe
Cantilever Geometry: Rectangular Cantilevers Number: 1
PS-LDPE-12M Vx & UVx The silicon die with patternedlayerHarmoniX Training Sample for MultiMode and Dimenstion SPMs, 12mm DESCRIPTION HarmoniX Training Sample for MultiMode and Dimension SPMs A two component polymer sample mounted on a 12mm steel sample puck for training researchers in the use of HarmoniX mode. This sample provides excellent contrast in elastic modulus, and some adhesion and dissipation contrast as well. A blend of Polystyrene and Polyolefin Elastomer (ethylene octene copolymer) are spin
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